Steven M. McDonald
Director Sales at Photronics Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 11 December 2009 Paper
Proceedings Volume 7520, 752017 (2009) https://doi.org/10.1117/12.838246
KEYWORDS: Photomasks, Lithography, SRAF, Quartz, Optical proximity correction, Etching, Critical dimension metrology, Manufacturing, Phase shifts, Lithographic illumination

Proceedings Article | 11 May 2009 Paper
Proceedings Volume 7379, 73790F (2009) https://doi.org/10.1117/12.824256
KEYWORDS: Reticles, Air contamination, Photomasks, Semiconducting wafers, Inspection, Wafer inspection, Semiconductors, Pellicles, Scanners, Manufacturing

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