A quad-slits interferometer using visible light is designed to measure the transverse beam-profile of Hefei Light SourceII (HLS-II). On the basis of the basic beam parameters of the B7 source point, the preliminary simulation results are obtained by using the Synchrotron Radiation Workshop (SRW) code. In addition, the core parameters of the quad-slits component in the interferometer are further optimized.
It is well-known that the synchrotron radiation light source (SRLS) possesses the unparalleled superior characteristic compared with other light sources. Therefore, the investigation and development of the advanced SRLS has always been a major international hotspot. At the same time, there are more and more researcher are actively devoted to construct the new generation of light source in China. For example, the Hefei Advanced Light Facility (HALF) in University of Science and Technology of China (USTC), etc. For HALF, in order to provide machine researchers and users with an intuitive reflection of the quality of the light source, it is necessary to develop a synchrotron light spot measurement system which is employed for real-time and non-destructive monitoring the synchrotron light spot size. According to the pre-designed parameters of HALF, which corresponding to the characteristic wavelength is 0.5 nm. Obviously, the general optical material cannot be satisfied the imaging requirements in this wavelength. Furthermore, the transverse profile of the synchrotron light spot of HALF is need to be less than 10 μm, of which puts forward higher resolution requirement for the synchrotron light imaging measurement system. In view of the above-mentioned characteristics, in this paper, we concentrate on improving a monitor based on Fresnel Zone Plate (FZP) for measuring the synchrotron light spot size. In terms of the numerical simulation and theoretical analysis of the diffraction of the light source, it is shown that the simulated results are in good agreement with the pre-designed values.
A longitudinal electron bunch diagnostics system is developing to measure the longitudinal bunch charge distribution for the new IRFEL at National Synchrotron Radiation Laboratory (NSRL). We use a Martin-Puplett interferometer, which is essentially a Michelson interferometer, to measure the spectrum of the coherent transition radiation produced by electrons through a thin metallic foil. Frequency components of coherent transition radiation have a relationship with the bunch form factor, which is described by the square modulus of the Fourier transform of the bunch distribution. Then several techniques, including a Kramers-Kronig analysis, have been applied to determine the longitudinal bunch charge distribution. The details of the design and theoretical investigation will be described in this paper.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.