Tobias Waber
at Hochschule für Angewandte Wissenschaften München
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 May 2013 Paper
T. Waber, W. Pahl, M. Schmidt, G. Feiertag, S. Stufler, R. Dudek, A. Leidl
Proceedings Volume 8763, 87632D (2013) https://doi.org/10.1117/12.2016459
KEYWORDS: Sensors, Packaging, Copper, Adhesives, Microelectromechanical systems, Aluminum, Ceramics, Standards development, Temperature metrology, Sensor technology

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