Dr. Urs Heine
at ams-OSRAM International GmbH
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 15 March 2023 Presentation + Paper
S. Gerhard, L. Nähle, B. Jentzsch, H. König, E. Reiger, U. Heine, S. Tautz, C. Eichler, G. Brüderl, T. Wurm, D. Borovac, M. Behringer, L. Kreiner, M. Jama, N. von Malm, A. Balck, M. Baumann, V. Krause
Proceedings Volume 12421, 124210G (2023) https://doi.org/10.1117/12.2648293
KEYWORDS: Laser resonators, Emission wavelengths, Photonic integrated circuits, Mirrors, Laser applications, Indium gallium nitride, Semiconductor lasers, Design and modelling, Laser development, Waveguides

Proceedings Article | 2 March 2020 Paper
Harald König, Sven Gerhard, Muhammad Ali, Urs Heine, Sönke Tautz, Christoph Eichler, Georg Brüderl, Matthias Peter, Alfred Lell, Martin Behringer, Markus Keidler, Tobias Haupeltshofer, Christoph Walter, Markus Baumann, Anne Balck, Volker Krause
Proceedings Volume 11262, 112620Q (2020) https://doi.org/10.1117/12.2543306
KEYWORDS: Semiconductor lasers, High power lasers, Fiber coupled lasers, Diodes, Reliability, Copper, Materials processing, Fiber couplers, Laser development, Laser processing

Proceedings Article | 14 March 2019 Paper
Harald König, Muhammad Ali, Werner Bergbauer, John Brückner, Georg Brüderl, Christoph Eichler, Sven Gerhard, Urs Heine, Alfred Lell, Lars Naehle, Matthias Peter, Jelena Ristic, Georg Rossbach, André Somers, Bernhard Stojetz, Soenke Tautz, Jan Wagner, Teresa Wurm, Uwe Strauss, Markus Baumann, Anne Balck, Volker Krause
Proceedings Volume 10939, 109390C (2019) https://doi.org/10.1117/12.2511976
KEYWORDS: Semiconductor lasers, Laser damage threshold, Laser applications, High power lasers, Materials processing, Gallium nitride, Projection systems, Laser processing, Fiber coupled lasers

Proceedings Article | 20 February 2017 Paper
Uwe Strauss, Andre Somers, Urs Heine, Teresa Wurm, Matthias Peter, Christoph Eichler, Sven Gerhard, Georg Bruederl, Soenke Tautz, Bernhard Stojetz, Andreas Loeffler, Harald Koenig
Proceedings Volume 10123, 101230A (2017) https://doi.org/10.1117/12.2254504
KEYWORDS: Semiconductor lasers, Gallium nitride, Laser applications, Gaussian beams, Reliability, Laser damage threshold, Waveguides, Laser video displays, Indium gallium nitride, Indium, Refractive index, Electro optics

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