Wei Gong
at Tongji Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 September 2018 Paper
Proceedings Volume 10747, 107470M (2018) https://doi.org/10.1117/12.2319557
KEYWORDS: Prisms, Error analysis, Refractive index, Ray tracing, Lithium, Mechanical engineering, Refraction, Nickel, Bismuth, Assembly tolerances

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