Mr. Nansen Zhou Profile

Nansen Zhou

at Chinese Univ of Hong Kong

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Author

Publications (7)

Proceedings Article | 13 March 2024 Poster

Exploring spatial phase resolution limit in epi-mode quantitative phase imaging

Nansen Zhou, Renjie Zhou

Proceedings Volume PC12852, PC128521Q (2024) https://doi.org/10.1117/12.3008497

KEYWORDS: Spatial resolution, Phase imaging, Image resolution, Imaging systems, Spectral resolution, Silicon, Semiconductors, Semiconducting wafers, Optoelectronics, Optical sensing

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Proceedings Article | 13 March 2024 Presentation

Cavity-enhanced quantitative phase profilometry for high contrast profiling of graphene

Nansen Zhou, Ting Huang, Yujie Nie, Zhaoli Gao, Renjie Zhou

Proceedings Volume PC12852, PC128520E (2024) https://doi.org/10.1117/12.3008495

KEYWORDS: Graphene, Profiling, Signal to noise ratio, Optical path differences, Film thickness, Silicon, Monolayers, Silicon films, Refractive index, Refraction

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Proceedings Article | 16 March 2023 Poster + Paper

Defining phase spatial resolution in quantitative phase imaging

Nansen Zhou, Renjie Zhou

Proceedings Volume 12389, 123890K (2023) https://doi.org/10.1117/12.2649974

KEYWORDS: Signal to noise ratio, Spatial resolution, Phase imaging, Wave equations, Phase measurement, Optical imaging

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Proceedings Article | 16 March 2023 Poster + Paper

High-resolution label-free cell imaging with angular information encoded dynamic speckle illumination

Xiantao Jiang, Nansen Zhou, Yijin Wang, Liting Duan, Renjie Zhou

Proceedings Volume 12389, 123890H (2023) https://doi.org/10.1117/12.2648109

KEYWORDS: Speckle, Light sources and illumination, Speckle pattern, Gaussian beams, Collimation, Signal to noise ratio, Image resolution, Spatial resolution, Beam diameter, Imaging systems

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Proceedings Article | 2 March 2022 Presentation + Paper

Fourfold resolution enhancement in quantitative phase microscopy through second harmonic generation and structured illumination

Nansen Zhou, Andreas Zheng, Renjie Zhou

Proceedings Volume 11970, 1197003 (2022) https://doi.org/10.1117/12.2610450

KEYWORDS: Second-harmonic generation, Resolution enhancement technologies, Microscopy, Image resolution, Refractive index, Imaging systems, Illumination engineering, Holograms, Phase imaging

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Proceedings Article | 8 March 2021 Presentation + Paper

Transparent thin-film metrology with a high sensitivity transmission-mode quantitative phase microscope

Yujie Nie, Nansen Zhou, Li Tao, Guodong Zhou, Ni Zhao, Jianbin Xu, Renjie Zhou

Proceedings Volume 11653, 116530E (2021) https://doi.org/10.1117/12.2579035

KEYWORDS: Thin films, Microscopes, Metrology, Thin film solar cells, Thin film devices, Atomic force microscopy, Transmission electron microscopy, Phase measurement, Laser interferometry, Transistors

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Proceedings Article | 5 March 2021 Poster + Presentation

label-free super-resolution imaging through second-harmonic generation structured illumination microscopy

Andreas Zheng, Nansen Zhou, Renjie Zhou

Proceedings Volume 11653, 116531N (2021) https://doi.org/10.1117/12.2578579

KEYWORDS: Spatial resolution, Spatial frequencies, Phase shifts, Phase shift keying, Second-harmonic generation, Super resolution, Microscopy, Diffraction, Yield improvement, Third-harmonic generation

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Showing 5 of 7 publications

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