Invited Paper: Selection Procedures for High Reliability Semiconductor Lasers

R. L. Hartman; F. R. Nash; P. J. Anthony

doi:10.1117/12.961062

15 May 1986 Invited Paper: Selection Procedures for High Reliability Semiconductor Lasers

R. L. Hartman, F. R. Nash, P. J. Anthony

Proceedings Volume 0616, Optical Technologies for Communication Satellite Applications; (1986) https://doi.org/10.1117/12.961062
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States

Abstract

This paper reviews the procedures we developed to select lasers for deployment in high reliability systems. The problem of screening out short-lived lasers with the aging controlled by low thermal activation energy failure mechanisms is analyzed. The rationale for and development of a purge (a set of laser-specific over-stresses) is described. Reliability results using real time device hours and more than 2 years of field use show that these selection procedures work well.

Citation Download Citation

R. L. Hartman, F. R. Nash, and P. J. Anthony "Invited Paper: Selection Procedures for High Reliability Semiconductor Lasers", Proc. SPIE 0616, Optical Technologies for Communication Satellite Applications, (15 May 1986); https://doi.org/10.1117/12.961062

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