Application Of Automatic Test Equipment (ATE) To Electro-Optic Test Of Neodymium Doped Yttrium Aluminum Garnet (ND:YAG) Lasers

Charles R. Pirnat

doi:10.1117/12.947181

4 August 1988 Application Of Automatic Test Equipment (ATE) To Electro-Optic Test Of Neodymium Doped Yttrium Aluminum Garnet (ND:YAG) Lasers

Charles R. Pirnat

Author Affiliations +

Proceedings Volume 0941, Automated Testing of Electro-Optical Systems; (1988) https://doi.org/10.1117/12.947181
Event: 1988 Technical Symposium on Optics, Electro-Optics, and Sensors, 1988, Orlando, FL, United States

Abstract

A specific application of ATE to laser optical measurements is discussed including the measurement requirements, selection of available computer and peripheral equipment, identification of any special equipment to be fabricated and computer language limitations. As the ATE is developed, hardware and software choices are made to maximize the speed, accuracy and reliability of the measurements. The application is completed with a brief summary of equipment performance in use.

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Charles R. Pirnat "Application Of Automatic Test Equipment (ATE) To Electro-Optic Test Of Neodymium Doped Yttrium Aluminum Garnet (ND:YAG) Lasers", Proc. SPIE 0941, Automated Testing of Electro-Optical Systems, (4 August 1988); https://doi.org/10.1117/12.947181

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