The Modelling Of X-Ray Reflectivity From Ideal And Imperfect Multilayer Systems.

P. G. Harper

doi:10.1117/12.948782

16 December 1988 The Modelling Of X-Ray Reflectivity From Ideal And Imperfect Multilayer Systems.

P. G. Harper

Proceedings Volume 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers; (1988) https://doi.org/10.1117/12.948782
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

A review is presented of current theoretical topics relating to the modelling of X-reflectivity from multilayer structures. The topics comprise: (1) Fresnel theory and its limitations; (2) atomic plane iterated diffraction; (3) sinusoidal layering and optical Bloch waves; (4) imperfect layers.

Citation Download Citation

P. G. Harper "The Modelling Of X-Ray Reflectivity From Ideal And Imperfect Multilayer Systems.", Proc. SPIE 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, (16 December 1988); https://doi.org/10.1117/12.948782

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