Design of non-contact measuring equipment for lunar sample sealing device

Chunyong Wang; Haoling Li; Cong Ma; Ming Ji

doi:10.1117/12.2246137

4 November 2016 Design of non-contact measuring equipment for lunar sample sealing device

Chunyong Wang, Haoling Li, Cong Ma, Ming Ji

Proceedings Volume 10026, Real-time Photonic Measurements, Data Management, and Processing II; 1002616 (2016) https://doi.org/10.1117/12.2246137
Event: SPIE/COS Photonics Asia, 2016, Beijing, China

Abstract

According to the thermal control coatings and the requirement of lunar sample sealing device parameters measuring The Non-contact measuring equipment is designed and calibrated. Some relevant experimentation is carried out and experiment result shows that the error of optical measuring system is consist with the contact measuring system in the Non-contact measuring equipment and the Non-contact measuring equipment can be used to measure characteristic parameters of lunar sample sealing device.

Citation Download Citation

Chunyong Wang, Haoling Li, Cong Ma, and Ming Ji "Design of non-contact measuring equipment for lunar sample sealing device", Proc. SPIE 10026, Real-time Photonic Measurements, Data Management, and Processing II, 1002616 (4 November 2016); https://doi.org/10.1117/12.2246137

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