Exploiting redundant phase information of a reflection matrix

Kenneth W. Burgi; Michael A. Marciniak; Stephen E. Nauyoks; Mark E. Oxley

doi:10.1117/12.2274575

25 August 2017 Exploiting redundant phase information of a reflection matrix

Kenneth W. Burgi, Michael A. Marciniak, Stephen E. Nauyoks, Mark E. Oxley

Proceedings Volume 10347, Optical Trapping and Optical Micromanipulation XIV; 103470K (2017) https://doi.org/10.1117/12.2274575
Event: SPIE Nanoscience + Engineering, 2017, San Diego, California, United States

Abstract

The reflection matrix (RM) measured from a rough-surface reflector contains the phase information of the light from each spatial light modulator (SLM) segment to every segment in the observation plane. This phase infor- mation can be used to produce phase maps that can refocus light to any segment in the observation plane. The measurement of an RM requires the optical system to be completely static; any disturbances result in degraded ability to refocus light. Diffraction based simulations show that RMs contain redundant phase information that can be exploited. A method is presented that allows control of the refocused light in the observation plane from a single reference phase map. This allows for the continuous optimization of the reference phase map, that compensates for system disturbances, while preserving the ability to control the location of the refocused light and eliminate the need to measure the entire RM.

Citation Download Citation

Kenneth W. Burgi, Michael A. Marciniak, Stephen E. Nauyoks, and Mark E. Oxley "Exploiting redundant phase information of a reflection matrix", Proc. SPIE 10347, Optical Trapping and Optical Micromanipulation XIV, 103470K (25 August 2017); https://doi.org/10.1117/12.2274575

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