Measurement of creep strain in polymers by means of electronic speckle pattern shearing interferometry

Juan Benito Pascual-Francisco; Orlando Susarrey-Huerta; Alexandre Michtchenko; Omar Barragán-Pérez

doi:10.1117/12.2303899

14 May 2018 Measurement of creep strain in polymers by means of electronic speckle pattern shearing interferometry

Juan Benito Pascual-Francisco, Orlando Susarrey-Huerta, Alexandre Michtchenko, Omar Barragán-Pérez

Proceedings Volume 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII; 106670H (2018) https://doi.org/10.1117/12.2303899
Event: SPIE Commercial + Scientific Sensing and Imaging, 2018, Orlando, FL, United States

Abstract

In this work, authors present a new application of electronic speckle pattern shearing interferometry (shearography) to a phenomenon known as creep compliance, which is an important mechanical property of viscoelastic materials. Two different sealing elastomers were tested in a short-term creep experiment, applying a constant tensile stress to a specimen. An experimental in-plane shearography setup was implemented to measure the in-plane creep strains produced in the tested object. In order to show the effectiveness of shearography for the assessment of this viscoelastic mechanical property, results were compared to that obtained with an equipment of Digital Image Correlation (DIC). It was demonstrated that shearography can be potentially and successfully applied to the creep analysis of these kind of materials. Finally, advantages and limitations of this measurement method are discussed.

Conference Presentation

Citation Download Citation

Juan Benito Pascual-Francisco, Orlando Susarrey-Huerta, Alexandre Michtchenko, and Omar Barragán-Pérez "Measurement of creep strain in polymers by means of electronic speckle pattern shearing interferometry ", Proc. SPIE 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII, 106670H (14 May 2018); https://doi.org/10.1117/12.2303899

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