Characterization of the reflectivity of various black materials II

Luke M. Schmidt; Madelynn Gomez; Doyeon Kim; Michael Torregosa; Marcus Sauseda; Travis Prochaska; D. L. DePoy; J. L. Marshall; Lawrence Gardner; Walter Grant

doi:10.1117/12.2312359

10 July 2018 Characterization of the reflectivity of various black materials II

Luke M. Schmidt, Madelynn Gomez, Doyeon Kim, Michael Torregosa, Marcus Sauseda, Travis Prochaska, D. L. DePoy, J. L. Marshall, Lawrence Gardner, Walter Grant

Author Affiliations +

Proceedings Volume 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III; 107065E (2018) https://doi.org/10.1117/12.2312359
Event: SPIE Astronomical Telescopes + Instrumentation, 2018, Austin, Texas, United States

Abstract

We report on an expanded catalog of total and specular reflectance measurements of various common (and uncommon) materials used in the construction and/or baffling of optical systems. Total reflectance is measured over a broad wavelength range (250 nm < λ < 2500 nm) that is applicable to ultraviolet, visible, and near-infrared instrumentation. Characterization of each sample's specular reflection was measured using a helium-neon laser in two degree steps from near normal to grazing angles of incidence. The total and specular reflection measurements were then used to derive the specular fraction of each material.

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Luke M. Schmidt, Madelynn Gomez, Doyeon Kim, Michael Torregosa, Marcus Sauseda, Travis Prochaska, D. L. DePoy, J. L. Marshall, Lawrence Gardner, and Walter Grant "Characterization of the reflectivity of various black materials II", Proc. SPIE 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III, 107065E (10 July 2018); https://doi.org/10.1117/12.2312359

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