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17 September 2018 Precision surface metrology and phase imaging based on femtosecond microwave photonics (Conference Presentation)
Kebin Shi
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Proceedings Volume 10753, Ultrafast Nonlinear Imaging and Spectroscopy VI; 107530Z (2018) https://doi.org/10.1117/12.2321297
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States
Abstract
Precisely detecting and controlling time jitter of femtosecond laser pulse train can enable high resolution phase measurement by using time of flight (TOF) scheme. In this presentation, we will introduce our recent progresses on precision surface metrology and phase imaging by utilizing high resolution synchronization between radio frequency reference source and femtosecond laser pulse train generated in a passively mode locked fiber laser.
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Kebin Shi "Precision surface metrology and phase imaging based on femtosecond microwave photonics (Conference Presentation)", Proc. SPIE 10753, Ultrafast Nonlinear Imaging and Spectroscopy VI, 107530Z (17 September 2018); https://doi.org/10.1117/12.2321297
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KEYWORDS
Femtosecond phenomena
Metrology
Phase imaging
Microwave photonics
Fiber lasers
Image resolution
Mode locking
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