Pockels effect in CdTe-based compounds with non-planar contact geometry (Conference Presentation)

Jan Franc; Václav Dedic; Martin Rejhon; Jan Kunc

doi:10.1117/12.2319933

18 September 2018 Pockels effect in CdTe-based compounds with non-planar contact geometry (Conference Presentation)

Jan Franc, Václav Dedic, Martin Rejhon, Jan Kunc

Proceedings Volume 10762, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX; 107620T (2018) https://doi.org/10.1117/12.2319933
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

Electric field measurements based on cross-polarizers technique on crystals showing Pockels effect are nowadays relatively widely used for characterization of detector materials such CdTe, CdZnTe, CdZnTeSe and GaAs. Our present study is focused on nonstandard cases, in which the electrodes have a non-planar geometry, especially strip and single pixel contact with opposite planar electrode. Electric field is simulated using Poisson’s equation and the transmittance distribution of the system consisting of the biased sample (Pockels cell) placed between two orthogonal polarizers is calculated. We compare the simulations with measurements on CdZnTe samples and discuss the limits of the electric field evaluation.

Conference Presentation

Citation Download Citation

Jan Franc, Václav Dedic, Martin Rejhon, and Jan Kunc "Pockels effect in CdTe-based compounds with non-planar contact geometry (Conference Presentation)", Proc. SPIE 10762, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX, 107620T (18 September 2018); https://doi.org/10.1117/12.2319933

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KEYWORDS

Electrodes

Crystals

Electric field sensors

Gallium arsenide

Polarizers

Sensors

Transmittance

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