Solid-state characterization of CdTe:Sn as a medium for adaptive interferometry

Konstantin Shcherbin; Serguey Odoulov; Dean R. Evans; François Ramaz; Bernard Briat

doi:10.1117/12.2514823

1 March 2019 Solid-state characterization of CdTe:Sn as a medium for adaptive interferometry

Konstantin Shcherbin, Serguey Odoulov, Dean R. Evans, François Ramaz, Bernard Briat

Author Affiliations +

Proceedings Volume 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology; 109341H (2019) https://doi.org/10.1117/12.2514823
Event: SPIE OPTO, 2019, San Francisco, California, United States

Abstract

Two-wave mixing adaptive interferometer based on photorefractive crystal allows for compensation of temporal disturbances in ambient environment and operation with speckled beams. The crystal should exhibit large effective trap density, low dark conductivity and large photoconductivity. Deliberately doped semiconductor may meet these requirements. In the present work the photorefractive, spectroscopic and magneto-optical study of CdTe:Sn is performed aiming to estimate these characteristics and to describe the space-charge formation. The photon energies for optical ionization/neutralization of the tin ions are estimated. The crystal is characterized as a medium for two-wave mixing adaptive interferometer with excellent performance.

Citation Download Citation

Konstantin Shcherbin, Serguey Odoulov, Dean R. Evans, François Ramaz, and Bernard Briat "Solid-state characterization of CdTe:Sn as a medium for adaptive interferometry", Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341H (1 March 2019); https://doi.org/10.1117/12.2514823

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