Open Access Presentation
26 March 2019 Silicon-based quantum computing: manufacturing and metrology challenges (Conference Presentation)
Author Affiliations +
Abstract
Over the last 20 years there has been a steady increase in fundamental physics research and the hardware development needed to realize a quantum computer. However, in the last 5 years we have seen a dramatic increase in the interest from industry, including a variety of major semiconductor and technology leaders such as IBM, Google and Intel. This is the result of both a better understanding of the variety of problems that can be addressed and the impact that will come with quantum computing along with the emergence of a couple of potentially scalable hardware solutions. In a recent interview with a leading manufacturer, an aggressive strategy was laid out to achieve an operational 1000-qubit quantum computer within 5 years that can solve a variety of problems not addressable by conventional computing and the 10-year prospect to achieve a 1 million qubit machine that would “profoundly change society”. The major technology leaders view quantum information (QI) as a technology that they must begin to develop and understand today. Augmenting existing technology with QI is desirable, but , there are a variety of technical challenges to making silicon-based QI systems with the needed quantum properties and coherence times. New challenges in atomic precision and individual atom or electron effects that fundamentally affect device performance bring on a variety of new manufacturing and metrology challenges. Measuring electron spin coherence, exchange energies, and qubit fidelity are entirely new measurements for the semiconductor industry. Even the resolution of TEM may be inadequate, as TEM of a nominally 80 nm thick slice of silicon which averages many atoms together in a measurement where only one or two atoms can deeply change device performance, coherence times, or introduce charge offsets. After developing some of the first cold atom and ion trap quantum information demonstrations at NIST, we are now investing significantly in developing the supporting metrology and modeling methods needed to help industry develop and commercialize this new technology. In this presentation we will provide an overview of hardware solutions for quantum computing, future metrology needs and challenges to enable manufacturable quantum computers. Although industry leaders are now investing in superconducting qubits and silicon-based qubits, the two leading technologies, this talk will primarily focus on the principles of solid state silicon QI operation, manufacturing metrology solutions, and measurements needed to develop and evaluate viable technological solutions.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard M. Silver "Silicon-based quantum computing: manufacturing and metrology challenges (Conference Presentation)", Proc. SPIE 10959, Metrology, Inspection, and Process Control for Microlithography XXXIII, 1095903 (26 March 2019); https://doi.org/10.1117/12.2517365
Advertisement
Advertisement
KEYWORDS
Quantum computing

Manufacturing

Metrology

Silicon

Chemical species

Quantum communications

Quantum information

RELATED CONTENT

Dynamics of two atom two photon Tavis Cummings model with...
Proceedings of SPIE (January 30 2014)
Quantum discord in central spin model
Proceedings of SPIE (December 18 2014)
Dynamics of atomic entanglement induced by field
Proceedings of SPIE (January 30 2014)
Non-equilibrium plasma science and industries of the future
Proceedings of SPIE (January 01 1900)
Entanglement of formation of pair of quantum dots
Proceedings of SPIE (October 25 2011)
Resonant-tunneling solid state NMR quantum computer
Proceedings of SPIE (July 23 2003)

Back to Top