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7 March 2019 More efficient optical sectioning structured illumination microscopy
Changchun Chai, He Zhou, Peng Zhou, Chi Zhang, Hongzhou Yan, Xiaojun Liu
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Proceedings Volume 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation; 1105338 (2019) https://doi.org/10.1117/12.2512099
Event: 10th International Symposium on Precision Engineering Measurements and Instrumentation (ISPEMI 2018), 2018, Kunming, China
Abstract
In this paper, a structural illumination based technology for microscopic surface topography measurement is investigated, in which only one shot structural illumination image is grabbed and a more efficient optical sectioned image reconstruction algorithm based on Hilbert transform was proposed. Compared with other methods, the technology can avoid strip artefacts problems of in-focus images resulting from the sinusoidal phases mismatch in spatial domain in conventional three-step phase-shifting since the phase-shifting steps decreases from three to one, and the measurement time is decreased effectively. The experimental testing is carried out to verify the feasibility and its measurement accuracy.
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Changchun Chai, He Zhou, Peng Zhou, Chi Zhang, Hongzhou Yan, and Xiaojun Liu "More efficient optical sectioning structured illumination microscopy", Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 1105338 (7 March 2019); https://doi.org/10.1117/12.2512099
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KEYWORDS
Reconstruction algorithms
3D image reconstruction
Digital micromirror devices
Fourier transforms
Microscopy
Phase shifts
Spatial frequencies
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