Presentation + Paper
21 June 2019 Measurement of mid-spatial frequency errors on freeform optics using deflectometry
Todd Blalock, Brittany Cox, Brian Myer
Author Affiliations +
Abstract
Freeform optics have emerged as a new tool for optical designers and integrators. Manufacturing innovations are gradually increasing availability of precision freeform optics. As optics manufacturers strive to improve quality and decrease cost, some focus is placed on improvements in the challenging metrology requirements for freeforms. One relevant technique to be discussed here is the use of deflectometry to measure mid-spatial frequency error in-process or in-situ during the manufacturing of freeform parts. Deflectometry can measure the mid-spatial frequency error on freeform parts orders of magnitude faster than traditional tactile metrology tools at similar or better accuracy.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Todd Blalock, Brittany Cox, and Brian Myer "Measurement of mid-spatial frequency errors on freeform optics using deflectometry", Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110561H (21 June 2019); https://doi.org/10.1117/12.2526162
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Deflectometry

Cameras

Freeform optics

Optics manufacturing

Metrology

Calibration

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