Open Access Paper
1 November 2019 Front Matter: Volume 11132
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 11132, including the Title Page, Copyright Information, Table of Contents, Author and Conference Committee lists.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Polarization Science and Remote Sensing IX, edited by Julia M. Craven, Joseph A. Shaw, Frans Snik, Proceedings of SPIE Vol. 11132 (SPIE, Bellingham, WA, 2019) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510629578

ISBN: 9781510629585 (electronic)

Published by

SPIE

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Copyright © 2019, Society of Photo-Optical Instrumentation Engineers.

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Printed in the United States of America by Curran Associates, Inc., under license from SPIE.

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Alenin, Andrey S., 0I

Altaqui, Ali, 0N

B. S., Mahima Sharma, 14

Bashar, Farhana, 0I

Baur, Tom, 0L, 0U

Bruce, Neil C., 0J, 0O, 0Q

Campo, Jochen, 08

Cervantes Lozano, Francisco J., 13

Chang, Lena, 0Z, 10

Chang, Yang-Lang, 0Z, 10

Chanumolu, Anantha, 08

Chen, Yi-Ting, 0Z

Chen, Yu-Jen, 0Z, 10

Chigrinov, V. G., 0X

Chrysler, Benjamin D., 0H, 0P

Dahlgren, Robert, 05

Daughtry, Craig, 05

Demory, Brice-Olivier, 0A

Dennis Joseph, Leena, 14

Dingjan, Jos, 08

Doelman, David S., 0A

Eshelman, Laura M., 06, 0C

Fernandez, Cristina, 08

Flores, Jorge L., 13

Franco-Ortega, J. Alejandro, 0O

Gao, Wei, 04

García Torales, Guillermo, 13

Guo, Qi, 0X

Hagen, Nathan, 0E, 0H, 0M, 0P

Haider, Ali, 15

Hasekamp, Otto, 08

Hoeijmakers, H. Jens, 0A

Holtsberry, Bryan L., 03

Hopkins, Connor, 09

Hu, Xiao-Bo, 04

Hung, Ming-Hung, 10

Jovanovic, Nemanja, 09

Keller, Christoph U., 0A

Konacki, Maciej, 0B

Kozłowski, Stanisław, 0B

Kraemer, Michael, 0L, 0U

Kudenov, Michael W., 0N, 0V

Kühn, Jonas, 0A

Kurtz, Joseph, 0I

Kwok, H. S., 0X

Macias-Mendoza, Humberto, 13

Mawet, Dimitri, 09

Milburn, Jennifer W., 09

Millar-Blanchaer, Maxwell, 09

Montes-González, Iván, 0J

Mora-Núñez, Azael, 13

Nalla, Raj, 08

Otani, Yukitoshi, 0H, 0M, 0P

Palatnick, Skyler, 09

Pallichadath, Vidhya, 0A

Pantalone, Brett, 0V

Parra Escamilla, Geliztle A., 13

Patty, C. H. Lucas, 0A

Pilichowski, Maciej, 0B

Poch, Olivier, 0A

Pommerol, Antoine, 0A

Porter, Michael, 09

Ramírez, Claudio N., 0Q

Rehbein, Elizabeth M., 06

Rietjens, Jeroen, 08

Rodríguez-Herrera, Oscar G., 0O, 0Q

Rodríguez-Núñez, O., 0J

Rosales-Guzmán, Carmelo, 04

Rosete-Aguilar, Martha, 0Q

Santiago Hernández, Héctor, 13

Serabyn, Eugene, 09

Serrano-García, David I., 13

Shaw, Glenn E., 0C

Shaw, Joseph A., 06, 0C

Shearer, Andy, 0B

Shibata, Shuhei, 0M

Słowikowska, Agnieszka, 0B

Smit, Martijn, 08

Snik, Frans, 0A

Stam, Daphne M., 0A

Sybilska, Agnieszka, 0B

Sybilski, Piotr, 0B

Tadokoro, Toshiyasu, 0E

Tan, Songxin, 15

Tauc, Martin Jan, 06, 0C

Tinyanont, Samaporn, 09

Tyo, J. Scott, 0I, 0K

Unni, Sujatha Narayanan, 14

van Amerongen, Aaldert, 08

Vanderbilt, Vern, 05

Vasisht, Gautam, 09

Vaughn, Israel J., 0K

Voelz, David G., 03

Wu, Ruotong, 0X

Yan, Kexin, 0X

Zhao, Bo, 04

Zhao, Huijie, 0X

Zhu, Zhi-Han, 04

Conference Committee

Program Track Chair

  • Allen H.-L. Huang, University of Wisconsin-Madison (United States)

Conference Chairs

  • Julia M. Craven, Sandia National Laboratories (United States)

  • Joseph A. Shaw, Montana State University (United States)

  • Frans Snik, Leiden University (Netherlands)

Conference Program Committee

  • Bruce E. Bernacki, Pacific Northwest National Laboratory (United States)

  • David B. Chenault, Polaris Sensor Technologies, Inc. (United States)

  • Russell A. Chipman, Wyant College of Optical Sciences (United States)

  • Aristide C. Dogariu, CREOL, The College of Optics and Photonics, University of Central Florida (United States)

  • Dennis H. Goldstein, Polaris Sensor Technologies Inc. (United States)

  • Michael Kudenov, North Carolina State University (United States)

  • Charles F. LaCasse, Sandia National Laboratories (United States)

  • Kazuhiko Oka, Hirosaki University (Japan)

  • Yoav Y. Schechner, Technion-Israel Institute of Technology (Israel)

  • Jean-Marc Thériault, Defence Research and Development Canada, Valcartier (Canada)

  • J. Scott Tyo, UNSW Canberra (Australia)

Session Chairs

  • 1 Polarization Display and Visualization

    Joseph A. Shaw, Montana State University (United States)

  • 2 Polarization in Remote Sensing I

    Julia M. Craven, Sandia National Laboratories (United States)

  • 3 Polarization in Remote Sensing II

    Charles F. LaCasse, Sandia National Laboratories (United States)

    Polarization Photo Show

    Joseph A. Shaw, Montana State University (United States)

  • 4 Polarization Phenomenology of Natural and Artificial Scenes

    Frans Snik, Leiden Observatory (Netherlands)

  • 5 Polarization Analysis of Optical Systems

    J. Scott Tyo, UNSW Canberra (Australia)

  • 6 Polarization Metrology and Instrumentation I

    Julia M. Craven, Sandia National Laboratories (United States)

  • 7 Polarization Metrology and Instrumentation II

    Michael W. Kudenov, North Carolina State University (United States)

  • 8 Polarization Metrology and Instrumentation III

    Frans Snik, Leiden Observatory (Netherlands)

  • 9 Polarization Optical Systems and Components

    Russell A. Chipman, Wyant College of Optical Sciences (United States)

© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11132", Proc. SPIE 11132, Polarization Science and Remote Sensing IX, 1113201 (1 November 2019); https://doi.org/10.1117/12.2551654
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KEYWORDS
Polarization

Remote sensing

Polarimetry

Metrology

Current controlled current source

Error analysis

Dynamic light scattering

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