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9 March 2020 Directly measuring spectrometer resolution from excess noise correlations (Conference Presentation)
Aaron M. Kho, Tingwei Zhang, Conrad W. Merkle, Vivek J. Srinivasan
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Proceedings Volume 11228, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXIV; 1122818 (2020) https://doi.org/10.1117/12.2542444
Event: SPIE BiOS, 2020, San Francisco, California, United States
Abstract
Spectral resolution is a crucial parameter in spectral / Fourier domain Optical Coherence Tomography (OCT). The sensitivity roll-off is determined by the spectral resolution, while depth-dependent axial resolution changes are caused by spectral resolution variations with wavelength. Currently, spectral resolution assessment is performed using either a narrow linewidth light source or broadband interferometry. Although commonly used, these methods require either additional components or time-consuming procedures. Here, we present a simple method to directly measure the spectral resolution at all wavelengths based on excess noise correlations. We apply this method to a visible light OCT system and validate it against interferometry.
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Aaron M. Kho, Tingwei Zhang, Conrad W. Merkle, and Vivek J. Srinivasan "Directly measuring spectrometer resolution from excess noise correlations (Conference Presentation)", Proc. SPIE 11228, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXIV, 1122818 (9 March 2020); https://doi.org/10.1117/12.2542444
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KEYWORDS
Spectroscopy
Spectral resolution
Optical coherence tomography
Supercontinuum sources
Image resolution
Interferometers
Interferometry
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