PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Freeform optics can enhance optical performance by reducing the number of elements, enabling lighter and more efficient systems, and by reducing aberrations. Most traditional manufacturing techniques cannot yield polished freeform optical surfaces. Likewise, traditional metrology equipment has difficulty accurately measuring the deviation of freeform surfaces from their nominal shape, the surface form error. The freeform manufacturing process requires control of both the surface form and the surface location simultaneously. The combination of both surface location and form error is referred to as total error. Inclusion of mechanical fiducials on freeform optics allows for precise locating of all surfaces of an optic in reference to one another and provide a reference from which the freeform surface can be measured against. Alignment fiducials enable more precise measurement of total error and can also aid in alignment of the optic in the final assembly and test.
Jessica DeGroote Nelson,Matthew J. Brunelle,Todd F. Blalock, andDaniel Brooks
"Using total error measurements of freeforms during manufacturing to aid in alignment", Proc. SPIE 11451, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV, 114510U (13 December 2020); https://doi.org/10.1117/12.2562681
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Jessica DeGroote Nelson, Matthew J. Brunelle, Todd F. Blalock, Daniel Brooks, "Using total error measurements of freeforms during manufacturing to aid in alignment," Proc. SPIE 11451, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV, 114510U (13 December 2020); https://doi.org/10.1117/12.2562681