Presentation
23 August 2020 Metamaterials, deep learning, and optical super-resolution (Conference Presentation)
Nikolay I. Zheludev, Tanchao Pu, Guanghui Yuan, Jun Yu Ou, Vassili Savinov, Nikitas Papasimakis
Author Affiliations +
Abstract
We introduce a non-intrusive far-field optical microscopy, which reveals the fine structure of an object through its far-field scattering pattern under illumination with topologically structured light containing deeply subwavelength singularity features. The object is reconstructed by a neural network trained on a large number of scattering events. We demonstrate resolving powers two orders of magnitude beyond the conventional “diffraction limit” of λ/2.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nikolay I. Zheludev, Tanchao Pu, Guanghui Yuan, Jun Yu Ou, Vassili Savinov, and Nikitas Papasimakis "Metamaterials, deep learning, and optical super-resolution (Conference Presentation)", Proc. SPIE 11460, Metamaterials, Metadevices, and Metasystems 2020, 114601A (23 August 2020); https://doi.org/10.1117/12.2568743
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KEYWORDS
Metamaterials

Super resolution

Light scattering

Scattering

Diffraction

Neural networks

Optical microscopy

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