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We introduce a non-intrusive far-field optical microscopy, which reveals the fine structure of an object through its far-field scattering pattern under illumination with topologically structured light containing deeply subwavelength singularity features. The object is reconstructed by a neural network trained on a large number of scattering events. We demonstrate resolving powers two orders of magnitude beyond the conventional “diffraction limit” of λ/2.
Nikolay I. Zheludev,Tanchao Pu,Guanghui Yuan,Jun Yu Ou,Vassili Savinov, andNikitas Papasimakis
"Metamaterials, deep learning, and optical super-resolution (Conference Presentation)", Proc. SPIE 11460, Metamaterials, Metadevices, and Metasystems 2020, 114601A (23 August 2020); https://doi.org/10.1117/12.2568743
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Nikolay I. Zheludev, Tanchao Pu, Guanghui Yuan, Jun Yu Ou, Vassili Savinov, Nikitas Papasimakis, "Metamaterials, deep learning, and optical super-resolution (Conference Presentation)," Proc. SPIE 11460, Metamaterials, Metadevices, and Metasystems 2020, 114601A (23 August 2020); https://doi.org/10.1117/12.2568743