Presentation
20 August 2020 Near-field imaging and spectroscopy of layered excitonic heterostructures
Author Affiliations +
Abstract
In this talk we will present the use of near-field scanning probe microscopy and spectroscopy to investigate the electronic and optical quality of excitonic semiconductors. We will use two-dimensional (2D) transition metal dichalcogenides (TMDCs) of Mo and W as prototypical examples but extend our measurements to other low-dimensional excitonic systems including colloidal quantum dots, organic assemblies and layered hybrid perovskites. Via near-field photoluminescence spectroscopy we will show the nanoscale variations in quality of the contact with substrates and disorder at the interface in case of junctions or heterostructures. By placing a plasmonic metal substrate nearby and varying the distance, we will also show exciton hybridization with surface plasmons into propagating hybrid surface modes.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Deep Jariwala "Near-field imaging and spectroscopy of layered excitonic heterostructures", Proc. SPIE 11468, Enhanced Spectroscopies and Nanoimaging 2020, 114680B (20 August 2020); https://doi.org/10.1117/12.2569061
Advertisement
Advertisement
KEYWORDS
Imaging spectroscopy

Heterojunctions

Spectroscopy

Near field scanning optical microscopy

Near field

Molybdenum

Near field optics

Back to Top