Short reach, high temperature operation and high reliability silicon photonic micro-transceivers for embedded and co-packaged system integration

Kazuhiko Kurata; Yasuhiko Hagihara; Mitsuru Kurihara; Kenichiro Yashiki; Keizo Kinoshita; Kazuhiro Shiba; Makoto Kuwata; Takashi Muto; Shigeru Kobayashi; Naoto Baba; Kozo Fujii; Richard Pitwon

doi:10.1117/12.2576670

16 March 2021 Short reach, high temperature operation and high reliability silicon photonic micro-transceivers for embedded and co-packaged system integration

Kazuhiko Kurata, Yasuhiko Hagihara, Mitsuru Kurihara, Kenichiro Yashiki, Keizo Kinoshita, Kazuhiro Shiba, Makoto Kuwata, Takashi Muto, Shigeru Kobayashi, Naoto Baba, Kozo Fujii, Richard Pitwon

Author Affiliations +

Proceedings Volume 11692, Optical Interconnects XXI; 1169204 (2021) https://doi.org/10.1117/12.2576670
Event: SPIE OPTO, 2021, Online Only

Abstract

We report on the design and performance of a silicon photonic micro-transceiver required to operate in high ambient temperature environments above 105°C. The four channel “I/O core” micro-transceiver incorporates a 1310 nm Quantum Dot laser system and operates at a data-rate of 32 Gbps per lane. The 5mm x 5mm micro-transceiver chip benefits from a multimode coupling interface for low-cost assembly and robust connectivity at high temperatures and an optical redundancy circuit, increasing reliability by over an order of magnitude. I/O core is a photonic building block used to construct more complex application-customized modules such as 512 Gb/s modules for HPC, 5G and AI systems.

Conference Presentation

Citation Download Citation

Kazuhiko Kurata, Yasuhiko Hagihara, Mitsuru Kurihara, Kenichiro Yashiki, Keizo Kinoshita, Kazuhiro Shiba, Makoto Kuwata, Takashi Muto, Shigeru Kobayashi, Naoto Baba, Kozo Fujii, and Richard Pitwon "Short reach, high temperature operation and high reliability silicon photonic micro-transceivers for embedded and co-packaged system integration", Proc. SPIE 11692, Optical Interconnects XXI, 1169204 (16 March 2021); https://doi.org/10.1117/12.2576670

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available