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8 July 2021 Temporal characterization of a plasma-based seeded XUV laser using a laser-dressed photoionization technique
L. Dakroub, T. Sinyakova, D. Cubaynes, A. K. Pandey, M. Pittman, E. Baynard, C. Bourassin-Bouchet, O. Guilbaud, A. Klisnick
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Proceedings Volume 11886, International Conference on X-Ray Lasers 2020; 118860N (2021) https://doi.org/10.1117/12.2594657
Event: XVII International Conference on X-Ray Lasers, 2020, Online Only
Abstract
We report on the development and implementation of a diagnostic for the temporal characterization of seeded XUV laser pulses, based on laser-dressed photoionization in the sideband regime, using a home-made velocity map-imaging spectrometer as the central element. The diagnostic was recently tested at the LASERIX facility with the seeded Ne-like titanium laser at 38 eV as the XUV source, overlapped with an infrared pulse of variable duration and intensity.
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L. Dakroub, T. Sinyakova, D. Cubaynes, A. K. Pandey, M. Pittman, E. Baynard, C. Bourassin-Bouchet, O. Guilbaud, and A. Klisnick "Temporal characterization of a plasma-based seeded XUV laser using a laser-dressed photoionization technique", Proc. SPIE 11886, International Conference on X-Ray Lasers 2020, 118860N (8 July 2021); https://doi.org/10.1117/12.2594657
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