Position independence for consistent effective atomic number (Zeff) estimation in dual-energy x-rays

Cevahir Çığla; Büşra Küçükateş; Ozan Yalçın; Duygu Selin Ak; Şükrücan Taylan Işıkoğlu

doi:10.1117/12.2663865

14 June 2023 Position independence for consistent effective atomic number (Z_eff) estimation in dual-energy x-rays

Cevahir Çığla, Büşra Küçükateş, Ozan Yalçın, Duygu Selin Ak, Şükrücan Taylan Işıkoğlu

Proceedings Volume 12531, Anomaly Detection and Imaging with X-Rays (ADIX) VIII; 125310C (2023) https://doi.org/10.1117/12.2663865
Event: SPIE Defense + Commercial Sensing, 2023, Orlando, Florida, United States

Abstract

A single-point energy source in X-Ray imaging devices has an artifact of energy loss due to the inverse square rule that also affects the penetration ability. The difference between low and Hi responses is the key feature for effective atomic number estimation in dual-energy X-Ray devices. As the penetration capability alters depending on the location of objects in the devices, the reliability of Z_eff estimates drops. Another reason behind this is the difference in the responses of low and Hi detectors, where Hi read-outs drop faster than Lo read-outs. Thus, the log ratio/Z_eff polynomial modeling estimates lower effective atomic numbers for the same objects as they get further from the generator. This study proposes a novel approach to handle position dependency on atomic number estimation supported by detailed analyses of material type and distance. We model the behavior of different metal/inorganic/organic materials according to their locations in the X-Ray conveyor band and implement a correction mapping approach to preserve the consistency of estimates. Consistency of Z_eff is very important, especially for threat detection, where threat regions are defined as limited Z_eff intervals for dual energy devices. The proposed approach enables material classification consistency against objects’ position on the conveyor band and provides a reliable infrastructure for alarm-based applications in X-Ray devices. The in-depth experiments for various objects, including inert explosives, organic materials, and metallic objects, show the robustness of the proposed band correction approach.

Conference Presentation

Citation Download Citation

Cevahir Çığla, Büşra Küçükateş, Ozan Yalçın, Duygu Selin Ak, and Şükrücan Taylan Işıkoğlu "Position independence for consistent effective atomic number (Z_eff) estimation in dual-energy x-rays", Proc. SPIE 12531, Anomaly Detection and Imaging with X-Rays (ADIX) VIII, 125310C (14 June 2023); https://doi.org/10.1117/12.2663865

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