Luminous target marker for vision based motion error measurement of machine tools

Daisuke Kono; Masahiro Toyoura

doi:10.1117/12.3005577

20 September 2023 Luminous target marker for vision based motion error measurement of machine tools

Daisuke Kono, Masahiro Toyoura

Proceedings Volume 12607, Optical Technology and Measurement for Industrial Applications Conference; 126070T (2023) https://doi.org/10.1117/12.3005577
Event: Optics and Photonics International Congress, 2023, Yokohama, Japan

Abstract

A luminous target marker was developed to measure motion errors of machine tools by motion capturing. The target marker consists of a polyacetal diffuser ball and high intensity LED light. The influence of the marker intensity on the fluctuation in the measured position was investigated. The negative correlation between the fluctuation amplitude and marker intensity was observed. Thus, the marker intensity should be enough high to obtain the uniform intensity distribution and decrease the fluctuation in the identified position. The measurement of circular motion trajectory was also demonstrated and compared to the measurement by a grid encoder that is conventionally used in two dimensional motion error evaluation of machine tools. The trajectory measured by the motion capturing was similar to that by the grid encoder in micrometer level. The quadrant glitch that is a typical dynamic motion error in machine tools was measured by the motion capturing even with 100 mm defocus. The experimental results showed the capability of motion error measurement with quick and easy installation by the motion capturing system.

Citation Download Citation

Daisuke Kono and Masahiro Toyoura "Luminous target marker for vision based motion error measurement of machine tools", Proc. SPIE 12607, Optical Technology and Measurement for Industrial Applications Conference, 126070T (20 September 2023); https://doi.org/10.1117/12.3005577

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KEYWORDS

Motion measurement

Light sources

High speed cameras

Signal intensity

Equipment

Light emitting diodes

3D metrology

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