Paper
28 November 2023 Low phase noise optical delay line optoelectronic oscillator uncertainty evaluation
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Abstract
In this paper, we present the operation of an optoelectronic oscillator. We look at the evaluation of the uncertainty associated with the measurement of the phase noise of the signal emitted by this oscillator. Uncertainty on the phase noise measured for a low phase noise compact optical delay line optoelectronic oscillator is evaluated as ±1.5 dB at 2 σ.
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Patrice Salzenstein "Low phase noise optical delay line optoelectronic oscillator uncertainty evaluation", Proc. SPIE 12764, Optoelectronic Devices and Integration XII, 127640Q (28 November 2023); https://doi.org/10.1117/12.2689283
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KEYWORDS
Oscillators

Optoelectronics

Measurement uncertainty

Uncertainty analysis

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