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Optical microscopy is an indispensable imaging tool in life science. However, light cannot be focused owing to high scattering, and hence, the imaging depth and spatial resolution are restricted. Here, we propose an imaging method that combines wavefront shaping and image scanning microscopy. The reflected signal is used as feedback to acquire an optimal phase that can refocus the scattered light behind the scattering media. The experimental results show that the proposed method works in multilayer scattering media and can improve both the resolution and imaging depth of optical microscopy.
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Tong Peng, Runze Li, Dan Dan, Chen Bai, Junwei Min, Meiling Zhou, Baoli Yao, "High-resolution imaging through scattering media by integration of wavefront shaping and imaging scanning microscopy," Proc. SPIE 12766, Advanced Optical Imaging Technologies VI, 127660V (29 November 2023); https://doi.org/10.1117/12.2686630