Spectrally responsive edge-illumination x-ray phase contrast imaging (XPCI)

Ava X. Hurlock; Sarah D. Ruiz; Timothy Koh; Michael E. Gehm

doi:10.1117/12.3013285

7 June 2024 Spectrally responsive edge-illumination x-ray phase contrast imaging (XPCI)

Ava X. Hurlock, Sarah D. Ruiz, Timothy Koh, Michael E. Gehm

Proceedings Volume 13043, Anomaly Detection and Imaging with X-Rays (ADIX) IX; 130430F (2024) https://doi.org/10.1117/12.3013285
Event: SPIE Defense + Commercial Sensing, 2024, National Harbor, Maryland, United States

Abstract

As opposed to transmission imaging, X-ray Phase Contrast Imaging (XPCI) produces images with higher contrast and allows us to distinguish between materials that are weakly attenuating or between materials that possess similar attenuation values. Edge Illumination (EI), a type of XPCI, utilizes spatial variation to uncover information about an object’s phase properties, such as the index of refraction. Instead of spatial variation, we previously proposed an alternative EI method, Spectrally Responsive Edge Illumination (SREI), which relies on energy variation. Prior SREI experimental efforts struggled to meet the necessary component performance requirements, so, as an intermediate step, we are currently focused on developing an energy resolving x-ray refractometer and a related database of materials. In this paper we will share our theory and initial proof of concept experimental results, as well as our next steps.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Ava X. Hurlock, Sarah D. Ruiz, Timothy Koh, and Michael E. Gehm "Spectrally responsive edge-illumination x-ray phase contrast imaging (XPCI)", Proc. SPIE 13043, Anomaly Detection and Imaging with X-Rays (ADIX) IX, 130430F (7 June 2024); https://doi.org/10.1117/12.3013285

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