Paper
5 July 2024 U2Net pipeline crack detection method with improved self-attention
Yuanhao Li, Xin Zuo
Author Affiliations +
Proceedings Volume 13184, Third International Conference on Electronic Information Engineering and Data Processing (EIEDP 2024); 1318475 (2024) https://doi.org/10.1117/12.3033198
Event: 3rd International Conference on Electronic Information Engineering and Data Processing (EIEDP 2024), 2024, Kuala Lumpur, Malaysia
Abstract
To solve the problem that the background of pipeline crack image is complicated and small crack is difficult to detect, an improved U2net pipeline crack detection algorithm based on self-attention is proposed. Firstly, expansion convolution is incorporated into the self-attention module to increase model sensitivity field and reduce image accuracy loss. Secondly, the improved self-attention module is integrated into the U2Net model to extract more global and local crack details. Finally, the detail-specific loss function is used to increase the weight of small cracks, thus effectively enhancing the detection ability of small cracks. The simulation experiment was carried out on the pipeline crack data set, and the experimental results showed that the accuracy of the improved U2Net model reached 71.4%, and the comprehensive evaluation index reached 64.0%. The improved U2Net model could accurately identify fine cracks, and the recognition effect was better than that of the U2net-Full and U2NET-Lite models. It has certain generalization and can be used effectively in the field of crack detection.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Yuanhao Li and Xin Zuo "U2Net pipeline crack detection method with improved self-attention", Proc. SPIE 13184, Third International Conference on Electronic Information Engineering and Data Processing (EIEDP 2024), 1318475 (5 July 2024); https://doi.org/10.1117/12.3033198
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image segmentation

Convolution

Data modeling

Education and training

Machine learning

Performance modeling

Deep learning

Back to Top