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Two techniques of nearfield microscopy using external and internal reflections are presented and the influence of polarization is discussed in the case of periodic struc ture imaging.
Christian Pieralli,S. Leblanc, andAlain Jalocha
"Periodic structure imaging by near-field microscopy", Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); https://doi.org/10.1117/12.34814
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Christian Pieralli, S. Leblanc, Alain Jalocha, "Periodic structure imaging by near-field microscopy," Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); https://doi.org/10.1117/12.34814