Coordinate measuring system for 2-D scanners

Vladimir V. Bukatin

doi:10.1117/12.28039

1 February 1991 Coordinate measuring system for 2-D scanners

Vladimir V. Bukatin

Proceedings Volume 1454, Beam Deflection and Scanning Technologies; (1991) https://doi.org/10.1117/12.28039
Event: Electronic Imaging '91, 1991, San Jose, CA, United States

Abstract

This paper investigates one of the possible designs of an optical-electronic system for identification of optical measuring signal parameters as a two-dimensional interference picture with spatial selection.

Citation Download Citation

Vladimir V. Bukatin "Coordinate measuring system for 2-D scanners", Proc. SPIE 1454, Beam Deflection and Scanning Technologies, (1 February 1991); https://doi.org/10.1117/12.28039

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available