CCD performance model

Oliver E. Dial

doi:10.1117/12.44514

1 August 1991 CCD performance model

Oliver E. Dial

Proceedings Volume 1479, Surveillance Technologies; (1991) https://doi.org/10.1117/12.44514
Event: Orlando '91, 1991, Orlando, FL, United States

Abstract

The Charge Coupled Device (CCD) has become the preferred image sensor for visible wavelengths because of its sensitivity, low noise, wide dynamic range, and high resolution. Temperature, readout frequency, electronics, and signal processing affect CCD noise and dynamic range. A mathematical model of these effects is presented. The model uses CCD specifications, typically provided by the manufacturer at room temperature and video frequency, to predict performance at other operating conditions. CCD performance can be improved by operating at low temperatures and low readout frequencies and by the use of appropriate support electronics and signal processing. Lowering CCD temperature reduces dark shot noise, dark signal non-uniformity, and Johnson noise. Correlated double sampling compensates for reset noise. Lower readout frequencies permit lower noise-bandwidth amplifiers. Calibration can compensate for pixel non-uniformities. The CCD model developed here describes these effects to enable prediction of CCD performance as a function of operating conditions and signal processing options.

Citation Download Citation

Oliver E. Dial "CCD performance model", Proc. SPIE 1479, Surveillance Technologies, (1 August 1991); https://doi.org/10.1117/12.44514

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