Soft x-ray ion chamber

Bo Chen; Ling Ma; Futian Li; Xingdan Chen

doi:10.1117/12.51245

1 January 1992 Soft x-ray ion chamber

Bo Chen, Ling Ma, Futian Li, Xingdan Chen

Proceedings Volume 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics; (1992) https://doi.org/10.1117/12.51245
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The technique of soft x-ray ion chamber includes the measurement of the ion current as a function of rare gas pressure in the ion chamber. The true photoionization current, and hence absolute photon flux, is obtained by extrapolating ion current to zero gas pressure. This paper describes measurement of the absolute photon flux at He II 25.6 nm and CK(alpha) 4.47 nm.

Citation Download Citation

Bo Chen, Ling Ma, Futian Li, and Xingdan Chen "Soft x-ray ion chamber", Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); https://doi.org/10.1117/12.51245

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