Paper
1 December 1991 Optical 3-D sensing for measurement of bottomhole pattern
Wan-Yong Su, Xianyu Su
Author Affiliations +
Abstract
We describe an optical 3-D sensing system by phase measuring profilemetry (PMP) for a 3-D bottom hole pattern. The principle, system construction, and experimental results are described.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wan-Yong Su and Xianyu Su "Optical 3-D sensing for measurement of bottomhole pattern", Proc. SPIE 1567, Applications of Digital Image Processing XIV, (1 December 1991); https://doi.org/10.1117/12.50856
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KEYWORDS
3D image processing

3D metrology

Digital image processing

Three dimensional sensing

3D surface sensing

Light sources and illumination

Optical sensing

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