Paper
1 March 1992 UV-VIS Fourier transform spectrometer with automatic adjustment
R. Stenzel, W. F. Bluhm, H. O. Tittel, Fernando Romero-Borja
Author Affiliations +
Proceedings Volume 1575, 8th Intl Conf on Fourier Transform Spectroscopy; (1992) https://doi.org/10.1117/12.56361
Event: Eighth International Conference on Fourier Transform Spectroscopy, 1991, Lubeck-Travemunde, Germany
Abstract
We present an UV-VIS Fourier Transform spectrometer with dynamic alignment and, in addition, automatic adjustment of the moving mirror before start and at each change of translation direction. In dynamic alignment the phase difference of laser interferograms from three points of the field of view is used to activate transducers holding the moving mirror. Whenever a run of the mirror is finished there is no interferogram for a few moments till the next run starts. The direction of translation is now opposite and due to the discontinuity of frictional forces in the drive there can be a misalignment of the moving mirror. If the misalignment leads to a phase difference greater than (pi) between the laser interferograms, correct alignment cannot be refound. To overcome this difficulty one can generate many laser interferograms instead of only three. Unless the interferograms from neighbor spots are out of phase by more than (pi) , the mirror can be realigned. Another solution of the problem which we present here is to modify the tilt of the moving mirror by means of piezo translators until the visibility of the interferogram of an expanded laser beam is at maximum.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Stenzel, W. F. Bluhm, H. O. Tittel, and Fernando Romero-Borja "UV-VIS Fourier transform spectrometer with automatic adjustment", Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); https://doi.org/10.1117/12.56361
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KEYWORDS
Mirrors

Spectroscopy

Fourier transforms

Visibility

Interferometers

Interferometry

Process control

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