Optically detected cyclotron resonance determination of the in-plane effective mass in Ga0.47In0.53As/InP single quantum wells

Par Omling; C. Wetzel; Al. L. Efros; P. Sobkowicz; A. Moll; B. K. Meyer

doi:10.1117/12.137600

3 September 1992 Optically detected cyclotron resonance determination of the in-plane effective mass in Ga_0.47In_0.53As/InP single quantum wells

Par Omling, C. Wetzel, Al. L. Efros, P. Sobkowicz, A. Moll, B. K. Meyer

Author Affiliations +

Proceedings Volume 1675, Quantum Well and Superlattice Physics IV; (1992) https://doi.org/10.1117/12.137600
Event: Semiconductors '92, 1992, Somerset, NJ, United States

Abstract

Measurements of the in-plane electron effective mass in GaInAs/InP single quantum wells as a function of well thickness using far-infrared optically detected cyclotron resonance (FIR- ODCR) is reported. The FIR-ODCR technique is described, the mechanism of detection is explained, and the experimental results are compared with a theoretical calculation. In the thinnest QW investigated (80 angstroms) the in-plane mass is found to increase by about 50% compared to the bulk GaInAs value.

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Par Omling, C. Wetzel, Al. L. Efros, P. Sobkowicz, A. Moll, and B. K. Meyer "Optically detected cyclotron resonance determination of the in-plane effective mass in Ga_0.47In_0.53As/InP single quantum wells", Proc. SPIE 1675, Quantum Well and Superlattice Physics IV, (3 September 1992); https://doi.org/10.1117/12.137600

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