Paper
1 September 1992 Element of a new infrared detector-plasma edge detector
Author Affiliations +
Abstract
Plasma reflectivity edge in infrared reflectivity spectra measured on narrow-gap semiconductors has been found to be most sensitive to the variation of carrier concentration based upon which a new way of infrared modulation has been studied. The modulation gain in power is impressively high. Thus a less sensitive room-temperature infrared detector could be as sensitive as the existing cooled infrared detectors in detecting middle-infrared radiation. The detectivity has been calculated.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dingrong Qian "Element of a new infrared detector-plasma edge detector", Proc. SPIE 1685, Infrared Detectors and Focal Plane Arrays II, (1 September 1992); https://doi.org/10.1117/12.137802
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KEYWORDS
Sensors

Reflectivity

Infrared radiation

Infrared detectors

Infrared sensors

Plasma

Modulation

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