Precision polarimetry of polarization components

Russell A. Chipman

doi:10.1117/12.138815

11 December 1992 Precision polarimetry of polarization components

Russell A. Chipman

Proceedings Volume 1746, Polarization Analysis and Measurement; (1992) https://doi.org/10.1117/12.138815
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

Polarization elements are inadequately characterized for many applications. For retarders, usually only the retardance is specified. For polarizers, usually only the two principal transmittances or the extinction ratio are given. For polarization elements used in critical applications, this level of characterization is woefully inadequate. Defects of polarization elements are described, and the Mueller calculus suggested as the most appropriate measure of performance. Examples of the characterization of polarization elements as a function of angle of incidence, and as a function of wavelength are provided.

Citation Download Citation

Russell A. Chipman "Precision polarimetry of polarization components", Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); https://doi.org/10.1117/12.138815

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