Near specular measurements of integrated scatter

James A. Bender; Timothy D. Henning; Marvin L. Bernt

doi:10.1117/12.140696

12 February 1993 Near specular measurements of integrated scatter

James A. Bender, Timothy D. Henning, Marvin L. Bernt

Proceedings Volume 1753, Stray Radiation in Optical Systems II; (1993) https://doi.org/10.1117/12.140696
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

Measurement of integrated scatter near the specular beam is an excellent way to qualify optics and optical coatings that are used in imaging systems. This paper reviews an instrument design to measure Total Integrated Scatter (TIS) over the range from 0.05 degree(s) to 3.0 degree(s) from specular. The measurement scheme utilizes an integrating plate instead of an integrating sphere.

Citation Download Citation

James A. Bender, Timothy D. Henning, and Marvin L. Bernt "Near specular measurements of integrated scatter", Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); https://doi.org/10.1117/12.140696

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