Simple method for measuring dynamic characteristics of optical and optoelectronic devices with subpicosecond resolution

Sergey A. Egorov; Yuri A. Ershov

doi:10.1117/12.145749

1 January 1993 Simple method for measuring dynamic characteristics of optical and optoelectronic devices with subpicosecond resolution

Sergey A. Egorov, Yuri A. Ershov

Author Affiliations +

Proceedings Volume 1801, 20th International Congress on High Speed Photography and Photonics; (1993) https://doi.org/10.1117/12.145749
Event: 20th International Congress on High Speed Photography and Photonics, 1992, Victoria, BC, Canada

Abstract

A simple technique based on an injection laser diode with electrical subcarrier modulation and the fiber Michelson interferometer usage for dynamic characteristics measuring of different optical and optoelectronic devices is described. The concept avoids the requirement for single mode components and does not suffer from many problems inherent to a traditional interferometric system. Experimental results have shown a time resolution of 0.2 ps with a dynamic range of more than 30 dB. The applicability of the technique for fiber optics sensing and diagnostics of fiber optics devices is demonstrated.

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Sergey A. Egorov and Yuri A. Ershov "Simple method for measuring dynamic characteristics of optical and optoelectronic devices with subpicosecond resolution", Proc. SPIE 1801, 20th International Congress on High Speed Photography and Photonics, (1 January 1993); https://doi.org/10.1117/12.145749

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