Preparing samples for scattering measurements--a cleaning study: part 2

Jeff L. Brown

doi:10.1117/12.162666

1 December 1993 Preparing samples for scattering measurements--a cleaning study: part 2

Jeff L. Brown

Proceedings Volume 1995, Optical Scattering: Applications, Measurement, and Theory II; (1993) https://doi.org/10.1117/12.162666
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Several cleaning methods suitable for cleaning small, low scatter samples in the laboratory are compared. In the present work, these cleaning methods were evaluated for other materials including uncoated fused silica, aluminum oxide and tantalum oxide coated fused silica, molybdenum, and gallium arsenide. The strip cleaners provide outstanding cleaning with drag wiping performing. In addition, results show that the durable surfaces can withstand repeated cleaning cycles. Gallium arsenide is a fragile material which does not stand up well to strip cleaning or solvent swabbing.

Citation Download Citation

Jeff L. Brown "Preparing samples for scattering measurements--a cleaning study: part 2", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); https://doi.org/10.1117/12.162666

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