Paper
1 December 1993 Scattering signatures of isolated surface features
Carina Kylner, Joakim P. Ingers, Lars H. Mattsson, Mans Bjuggren
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Abstract
A rigorous one-dimensional integral solution has been utilized to bring up some ideas about possible ways for detecting isolated surface defects by means of angle resolved scattering. Our preliminary results indicate that a suitable combination of polarization and different incidence angles can be useful. Numerical examples are given both for modelled defects and real defects measured with a Talystep profilometer.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carina Kylner, Joakim P. Ingers, Lars H. Mattsson, and Mans Bjuggren "Scattering signatures of isolated surface features", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); https://doi.org/10.1117/12.162657
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KEYWORDS
Scattering

Light scattering

Aluminum

Defect detection

Electromagnetic scattering

Integrated circuits

Metals

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