Paper
22 September 1993 Investigation on interference-type moire deflectometry
Zhaoshu Liao, Ru-Shou Lu, Jingguang Tao, KunTao Yang
Author Affiliations +
Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156274
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
A moire deflectometry without the Talbot effect is presented. A grating is replaced by interference fringes to overcome the inability of the Talbot pitch to change continuously. An additive type and a multiplicative type of moire deflectometry are described. The theory is analysed and the features are discussed with examples.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhaoshu Liao, Ru-Shou Lu, Jingguang Tao, and KunTao Yang "Investigation on interference-type moire deflectometry", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156274
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KEYWORDS
Deflectometry

Moire patterns

Crystals

Diffraction gratings

Ronchi rulings

Prisms

Receivers

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