Paper
4 January 1994 Millimeter-wave scanning surface resistance analyzer using a confocal resonator
Dawei Zhang, Jon S. Martens, C. F. Shih, Richard S. Withers, Scott A. Sachtjen, L. P. Suppan, Vincent Kotsubo, Chris P. Tigges
Author Affiliations +
Abstract
Millimeter-wave confocal resonators are used in a new, commercially available instrument to map the surface resistance of large area (2 - 4 inch diameter) superconducting thin films. Q-factors are measured from the reflection coefficient of the cavity formed by a spherical aluminum mirror and a planar conductor sitting at half the radius of curvature of the mirror. The surface resistance of the superconducting film is extracted from the measured Q values. Typical Rs values of 20 - 40 m(Omega) are measured for high-quality 2' high-Tc superconducting thin films at 94 GHz and 77 K.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dawei Zhang, Jon S. Martens, C. F. Shih, Richard S. Withers, Scott A. Sachtjen, L. P. Suppan, Vincent Kotsubo, and Chris P. Tigges "Millimeter-wave scanning surface resistance analyzer using a confocal resonator", Proc. SPIE 2156, High Tc Microwave Superconductors and Applications, (4 January 1994); https://doi.org/10.1117/12.166156
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Cited by 1 scholarly publication.
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KEYWORDS
Resistance

Mirrors

Resonators

Dielectrics

Superconductors

Confocal microscopy

Thin films

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