Verification, validation, and accreditation issues related to a new IR sensor test capability

Parker David Elrod; Heard S. Lowry; Gary R. Mattasits

doi:10.1117/12.180079

8 July 1994 Verification, validation, and accreditation issues related to a new IR sensor test capability

Parker David Elrod, Heard S. Lowry, Gary R. Mattasits

Author Affiliations +

Proceedings Volume 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V; (1994) https://doi.org/10.1117/12.180079
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

The Arnold Engineering Development Center (AEDC) has developed new test technologies and methodologies for realistic mission simulations testing of IR space-based sensors. These technologies and methodologies have been combined into an integrated approach for space sensor testing. Direct write scene generation plays a critical role in this integrated approach and is being applied in two new AEDC test facilities. Prior to performing the first test in such a new facility, a critical but often overlooked process must be completed. This critical process demonstrates that the test facility can indeed provide a realistic, NIST traceable simulation of a sensor's mission. This process is complex and must be uniquely tailored for each individual test facility and sensor mission. Such a process can be designed to address both developmental test and evaluation and operational test and evaluation concerns. A case study based on AEDC's direct write scene generation technology will be used to illustrate the issues related to the validation, verification, and accreditation process.

Citation Download Citation

Parker David Elrod, Heard S. Lowry, and Gary R. Mattasits "Verification, validation, and accreditation issues related to a new IR sensor test capability", Proc. SPIE 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V, (8 July 1994); https://doi.org/10.1117/12.180079

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