Enhanced backscattering from one-dimensional free-standing dielectric film

Zu-Han Gu; Jun Q. Lu; Alexei A. Maradudin; Eugenio R. Mendez

doi:10.1117/12.189210

7 October 1994 Enhanced backscattering from one-dimensional free-standing dielectric film

Zu-Han Gu, Jun Q. Lu, Alexei A. Maradudin, Eugenio R. Mendez

Proceedings Volume 2260, Stray Radiation in Optical Systems III; (1994) https://doi.org/10.1117/12.189210
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

It has been known for several years that not only a rough metallic surface but also a rough dielectric surface can produce an enhanced backscattering peak. Due to the difficulty in fabricating one- or two-dimensional dielectric rough surfaces with a high index of refraction or a free-standing film, no experiments have been able to reveal such a peak in scattering from a dielectric rough surface. In this paper we present experimental results of the enhanced backscattering from a free-standing dielectric film and compare these with theoretical analysis. The vacuum/dielectric interface is one-dimensional, randomly rough, while the second dielectric/vacuum interface is approximately planer. The numerical simulations for a one- dimensional, randomly rough free-standing dielectric film reveal some important information about the main mechanism for the enhanced backscattering peak, primarily the presence of the flat dielectric/vacuum interface. We believe that the coherent addition from a given light path that interacts with the rough dielectric surface at two different points due to its reflection from the back surface and its time-reversed partner leads to an enhancement of the intensity of scattering into the retroreflection direction with respect to the intensity of scattering into other directions.

Citation Download Citation

Zu-Han Gu, Jun Q. Lu, Alexei A. Maradudin, and Eugenio R. Mendez "Enhanced backscattering from one-dimensional free-standing dielectric film", Proc. SPIE 2260, Stray Radiation in Optical Systems III, (7 October 1994); https://doi.org/10.1117/12.189210

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KEYWORDS

Dielectrics

Backscatter

Interfaces

Light scattering

Scattering

Photoresist materials

Glasses

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