Challenges in IR system testing

Gerald C. Holst

doi:10.1117/12.188677

17 October 1994 Challenges in IR system testing

Gerald C. Holst

Proceedings Volume 2269, Infrared Technology XX; (1994) https://doi.org/10.1117/12.188677
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

A new generation of test equipment must be developed to meet the calibration needs of evolving infrared imaging systems. New systems can no longer be simply called sensors -- they are sensors with built-in computers. These systems modify images in new ways. As such, the traditional definitions of NEDT, MRT, MTF, and fixed pattern noise are questioned. New metrics may be needed to describe system performance. New performance metrics may also evolve that are less prone to measurements errors.

Citation Download Citation

Gerald C. Holst "Challenges in IR system testing", Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); https://doi.org/10.1117/12.188677

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